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Current Result Document :
ÇѱÛÁ¦¸ñ(Korean Title) |
Nanowire Reconfigurable Crossbar ±¸Á¶¸¦ À§ÇÑ °áÇÔ È¸ÇÇÇü ·ÎÁ÷ ÀçÇÒ´ç ¹æ½ÄÀÇ ºÐ¼®°ú ÃÑ ºñ¿ë¿¡ µû¸¥ ÃÖÀûÈ ¹æ¾È |
¿µ¹®Á¦¸ñ(English Title) |
Cost-Driven Optimization of Defect-Avoidant Logic Mapping Strategies for Nanowire Reconfigurable Crossbar Architecture |
ÀúÀÚ(Author) |
ÀÌÁ¾¼®
Ãֹμö
Jongseok Lee
Minsu Choi
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¿ø¹®¼ö·Ïó(Citation) |
VOL 37 NO. 05 PP. 0257 ~ 0271 (2010. 10) |
Çѱ۳»¿ë (Korean Abstract) |
Photolithography ÅëÇÕ ½Ã´ëÀÇ ³¡ÀÌ ºü¸£°Ô ´Ù°¡¿È¿¡ µû¶ó, ÃÖ±Ù¿¡´Â »õ·Î¿î ³ª³ë ½ºÄÉÀÏÀÇ ¼ÒÀç¿Í ÁýÀû ¹æ½Ä¿¡ ±â¹ÝÀ» µÐ ¼ö¸¹Àº ³ª³ë ½ºÄÉÀÏ ÀåÄ¡¿Í ½Ã½ºÅÛÀÌ ³ªÅ¸³ª°í ÀÖ´Ù. ƯÈ÷ nanowire crossbar ±¸Á¶¸¦ ÀÌ¿ëÇÑ ´Ù¾çÇÑ reconfigurable architecture µéÀÌ º¸°íµÇ°í ÀÖ´Ù. ÇÏÁö¸¸ ¾Æ½±°Ôµµ ³ª³ë ½ºÄÉÀÏÀÇ ±¸¼º ¿ä¼Ò¸¦ ÀÌ¿ëÇÑ ÀÌ·¯ÇÑ °íÁýÀû ½Ã½ºÅÛÀº »ý»ê ´Ü°è¿¡¼ ¹ß»ýÇÏ´Â °¢Á¾ ¹°¸®Àû °áÇÔ°ú ¿ÀÂ÷¿¡ Ãë¾àÇÏ¸ç µû¶ó¼ °áÇÔ¿¡ ´ëÇÑ °ü¿ë¼º Áï defecttolerance´Â nanowire reconfigurable crossbar ½Ã½ºÅÛ¿¡ ÀÖ¾î ÇØ°áÇØ¾ß ÇÒ °¡Àå Áß´ëÇÑ ¹®Á¦ Áß Çϳª¶ó ÇÒ ¼ö ÀÖ´Ù. ÀÌ¿¡ º» ³í¹®¿¡¼´Â nanowire reconfigurable crossbar ½Ã½ºÅÛ »ó¿¡¼ »ç¿ëµÇ¾îÁú ¼ö ÀÖ´Â ¼¼ °¡ÁöÀÇ °áÇÔ È¸ÇÇÇü(defectavoidant) ·ÎÁ÷ ÀçÇÒ´ç ¾Ë°í¸®µëÀ» ¼³¸íÇÏ°í ´Ù¾çÇÑ ¹æ½ÄÀ¸·Î Æò°¡ÇÏ¿´´Ù. ÀÌ¿¡ ´õºÒ¾î ·ÎÁ÷ ÀçÇÒ´ç½Ã¿¡ ¹ß»ýÇÏ´Â ºñ¿ë°ú ÀÌ·Î ÀÎÇØ ¾ò¾îÁö´Â repair performance¸¦ °è·®ÀûÀ¸·Î »óÈ£ ºÐ¼®ÇÏ¿© ÃÖÀûÈµÈ repair ¹æ½ÄÀ» ã¾Æ³»´Â »õ·Î¿î ¹æ¾ÈÀ» ¼Ò°³ÇÏ¿´´Ù. ÀÌ¾î ´Ù¾çÇÑ ÆĶó¸ÞÅ͵éÀ» ÀÌ¿ëÇÑ ½Ã¹Ä·¹ÀÌ¼Ç °á°ú¸¦ Á¦½ÃÇÔÀ¸·Î½á »õ·Î ¼Ò°³µÈ cost-driven repair ÃÖÀûÈ ¹æ½ÄÀ» °ËÁõÇÏ¿´´Ù. |
¿µ¹®³»¿ë (English Abstract) |
As the end of photolithographic integration era is approaching fast, numerous nanoscale devices and systems based on novel nanoscale materials and assembly techniques are recently emerging. Notably, various reconfigurable architectures with considerable promise have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density sys-tems consisting of nanometer-scale elements are likely to have numerous physical imperfections and variations. Therefore, defect-tolerance is considered as one of the most exigent challenges in nanowire crossbar systems. In this work, three different defect-avoidant logic mapping algorithms to circumvent defective crosspoints in nanowire reconfigurable crossbar systems are evaluated in terms of various performance metrics. Then, a novel method to find the most cost-effective repair solution is demonstrated by considering all major repair parameters and quantitatively estimating the performance and cost-effectiveness of each algorithm. Extensive parametric simulation results are reported to compare overall repair costs of the repair algorithms under consideration and to validate the cost-driven repair optimization technique. |
Å°¿öµå(Keyword) |
Nanoelectronics
Nanowire crossbar
Reconfigurable system
°áÇÔ È¸ÇÇ
·ÎÁ÷ÀçÇÒ´ç
Cost-driven optimization
Defect-tolerance
Logic mapping
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